1. Developments in materials charactrization technologies: symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA
پدیدآورنده : edited by George F. Vaner Voort, John J. Friel
کتابخانه: (طهران)
موضوع : Materials - Testing - Congresses , Non-destructive testing - Congresses , Materials - Microscopy - Congresses
رده :
TA
410
.
D48
1996